Circuit Edit, Device Modification

By: NanoScope Services Ltd  02/03/2011
Keywords: Focused Ion Beam, Circuit Edit, Device Modification,

Direct rewiring of fabricated IC's for proving mask changes before commiting to them - 1st time right!

Keywords: Circuit Edit, Device Modification, FIB analysis, Focused Ion Beam,

Other products and services from NanoScope Services Ltd

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Circuit Edit

Your 1st Silicon Emergency Service - rapid circuit edit with high sucees rates to your shorten time to market


X-ray and CSAM imaging of packages

Non-destructive analysis of die inside the plastic package - look for die attach, packaging or bonding issues before opening.


Package decap and resealing

Open plastic IC's for direct interventions and anlysis, and close them after modification for board level test ad attachment.


TEM sample preparation and Extraction

Prepare a TEM foil from a specific location and extract it to TEM grid without significant damage to your bulk